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Identification of Defects in Semiconductors

By: Germany) Weber Freiburg Eicke R. (Fraunhofer-Institut fur Solare Energiesysteme ISE (Author)

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Format: Hardback or Cased Book

ISBN-13: 9780127521596

Publisher: Elsevier Science Publishing Co Inc

Publication Date: Jul 2nd, 1998

Dimension: 22.90 x 15.20 x 80.00 cms

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Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.

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