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Digital Holography for MEMS and Microsystem Metrology

By: (Author) Anand Asundi

Werezi Extended Catalogue
Delivery in 34 days

Ksh 19,050.00

Format: Hardback or Cased Book

ISBN-10: 0470978694

ISBN-13: 9780470978696

Series: The Wiley Microsystem and Nanotechnology Series

Publisher: John Wiley & Sons Inc

Imprint: John Wiley & Sons Inc

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Jul 28th, 2011

Print length: 228 Pages

Weight: 486 grams

Dimensions (height x width x thickness): 23.70 x 16.40 x 1.90 cms

Product Classification: Electronics & communications engineering

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By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.

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