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Advances in Optics of Charged Particle Analyzers: Part 2 (Advances in Imaging and Electron Physics)

By: France) Hytch Toulouse Martin (Series editor)

Extended Catalogue

Ksh 48,150.00

Format: Hardback or Cased Book

ISBN-10: 0443317208

ISBN-13: 9780443317200

Collection / Series: Advances in Imaging and Electron Physics

Collection Type: Publisher collection

Publisher: Elsevier Science Publishing Co Inc

Imprint: Academic Press Inc

Country of Manufacture: GB

Country of Publication: GB

Publication Date: May 21st, 2025

Publication Status: Active

Product extent: 298 Pages

Weight: 450.00 grams

Product Classification / Subject(s): Mechanical engineering
Electronic devices & materials
Signal processing

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Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

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